Bruker D8 Advance diffractometer with Lynxeye XE-T detector enables the X-ray powder diffraction (XRPD) technique that is among the most important tools for materials characterization. Much of the information embedded in a powder pattern is derived directly from the atomic arrangement of the phases present.

Services:
- Identification of both crystalline and amorphous phases
- Determination of specimen purity
- Quantitative analysis of crystalline and amorphous phases
- Microstructure analysis
- Indexing, ab-initio crystal structure determination and crystal structure refinement